"QTLs for resistance to Phomopsis seed decay are associated with days to maturity in soybean (Glycine max)"

作者：Suli Sun, Moon Young Kim, Kyujung Van, Yin-Won Lee, Baodu Li, Suk-Ha Lee

影响因子：

刊物名称：Theoretical and Applied Genetics

出版年份：2013

卷：126  期：  页码：2029-2038

文章摘要：

Phomopsis seed decay (PSD), primarily caused by Phomopsis longicolla, is a major contributor to poor soybean seed quality and significant yield loss, particularly in early maturing soybean genotypes. However, it is not yet known whether PSD resistance is associated with early maturity. This study was conducted to identify quantitative trait loci (QTLs) for resistance to PSD and days to maturity using a recombinant inbred line (RIL) population derived from a cross between the PSD-resistant Taekwangkong and the PSD-susceptible SS2-2. Based on a genetic linkage map incorporating 117 simple sequence repeat markers, QTL analysis revealed two and three QTLs conferring PSD resistance and days to ma